Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Increasing Spatial Resolution and Extending Spectral Range of Synchrotron Infrared Microscopy

A New Approach to Infrared Microspectroscopy: Adding FT-IR to a Light Microscope

Applying Correlative Brightfield, Fluorescence, and Raman Microscopy to Determine and Track Component Locations in Formulations

Spectral Imaging with Near-Field Infrared Spectroscopy and Microscopy

Raman Microscopy and Remote Laser Raman Spectroscopy in Art History and Conservation Science: Analysis of Three Illuminated Gutenberg Bibles

Residual Surface Potentials in the Variable Pressure/ Environmental Scanning Electron Microscope

Charge Contrast Imaging of Gibbsite in the Variable Pressure SEM

ESEM Beam Current Measuring Device based on a Planar Schottky Diode

The Effect of Gas Atmospheres on Charging

Measurement of Elastic Cross-Sections for Gases

Structure, Chemistry and Properties of Grain Boundaries in H2SO4—Doped Ice

Scanning Electron Microscopy of Vostok Accretion Ice

Rietveld Refinement and HRTEM Simulation of Calcium -Lead Apatites

Electron Microscopy of In Situ Presolar Silicon Carbide

SEM Study and X-Ray Microanalysis of Lateritics from “Los Pijiguaos” Bauxite ore, Estado Bolívar, Venezuela

Automated X-ray Spectral Image Analysis of a Large Area of a Geological Material

Application of Spatial and Feature Analysis to Electron Microscope Petrography

Electron Microscopy Study of Mineral Colloids in the Ground Water Near Nevada Test Site

A Practical Application of Scanning Electron Microscopy to Characterize a Fine- Grained Sulfide Gold Ore

Electronprobe Microanalysis of Volcanic Glass at Cryogenic Temperatures

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract