Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Transmission Electron Microscopy Studies of Epitaxial Superconducting MgB2 Thin Film

Mossbauer and XPS analysis of Fe-SiO2 and Fe-SiO2/SiO2 granular films

TEM Characterization of Self-Assembled Magnetic Nanowires

Microscopy and Magnetoresistance studies in zigzag and semi-circle-in-series Permalloy wires

Low Temperature Dependence of HF-Magnetic Properties of Soft Nanostructured Films

TEM Study of Epitaxial Growth of La0.65Pb0.35MnO3 on LaAlO3 and Its Relation to Electronic Structure and Spin Polarization

Structure Analysis of CoPt Nanoparticles

Crystallographic Texture Study in Melt-Spun Pr-Fe-B 2:14:1 Based Nanocomposite Magnet

[010] Oxygen Ordering at Grain Boundaries in MgB2

The Use of Stereomicroscopy in Conjunction with In Situ Straining TEM for Studying Dislocation Behavior

Time Resolved Electron Energy Loss Spectroscopy as a Tool for Controlling and Monitoring the Early Stages of Electron Beam Induced Transformations

Combined Confocal Raman Microscope with Scanning Electron Microscope; A Parallel Analysis of Inorganic and Organic Materials

In-Situ Sem Analysis of Lithium Metal Polymer Battery

Microstuctural Studies Of The Chromia Stabilized Iron Oxide Water Gas Shift Catalyst

Electron Microscopy of Cr/Silica Catalyst for Ethylene Polymerization

Simulations of TEM Images of Nano-particles Embedded in Amorphous Ice

Atomic Scale Characterization of Oxygen Vacancy Dynamics by In -Situ Reduction and Analytical Atomic Resolution STEM

SEM/EDS Studies of Impurities in Natural Ice

Morphological Evolution and Junction Dynamics at Faceted Grain Boundaries

In situ Transmission Electron Microscopy Study of Dislocation Emission At Junctions Between Σ=3 Grain Boundaries In Gold Thin Films

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract