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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Characterization Microstructural of Kevlar-based Composites Obtained by Vacuum Infusion Process

Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis

Application of Zernike Phase-Contrast Electron Microscopy and Electron Tomography for Frozen Hydrated Complex Biological Specimens

Electron Irradiation Damage of MgO Nanocube

Atomic-Resolution EELS in Aberration-Corrected STEM

Correlating Irradiation-Induced Solute Clustering with Changes of Hardness in Low and High Flux Reactor Pressure Vessel Steels

Crystallographic and Nanomechanical Analysis by Correlative In-situ AFM & SEM

Application of Quantitative and Qualitative Mapping of Materials in Forensic Practice

Multiplexed Biomimetic Lipid Membranes on Graphene by Dip-Pen Nanolithography

Parallel Beam Wavelength X-Ray Spectroscopy: An Evaluation of Current Performance

New metastable carbon phases observed by HRTEM

Observation of Magnetic Circular Dichroism in the Electron Microscope

Indium-Tin-Oxide (ITO) as Stable and Effective Coating Material for Correlative Confocal and Immuno-Scanning Electron Microscopy Studies

Atomic-Scale Quantitative Three-Dimensional Characterization with a Local Electrode Atom Probe

High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2

Advances and Challenges in Electron Tomography

In-Situ Measurements of Single Walled Carbon Nanotube Growth Reveal the Structures of Active and Inactive Catalyst Nanoparticles

Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector

Characterization of Titanium Dioxide Pigment Particles by High-Resolution and Analytical Transmission Electron Microscopy (HRTEM and AEM)

Projection Structures of DNA-Dps Co-crystals are Determined by the Length of the Incorporated DNA

Microscopy and Microanalysis

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