Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM

Aberration-corrected Scanning Transmission Electron Microscopy and Spectroscopy of Nonprecious Metal Nanoparticles in Titania Aerogels

The Combination of STEM Tomography and STEM/EDS Analysis of NiSi Formation Related Defects in Semiconductor Wafer-foundries

Beyond Electrochemical Analysis: 2D to 4D Correlation of Structure and Chemistry in Li-ion Batteries

A Challenge to Multivariate Statistical Analysis: Spent Nuclear Fuel

Characterization of Palladium and Gold Nanoparticles on Granular Activated Carbon as an Efficient Catalyst for Hydrodechlorination of Trichloroethylene

Minimize Electron Beam Damage during Characterization of Carbon-Depletion in Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping

Performance of a Direct Electron Detector for the Application of Electron Energy-Loss Spectroscopy

Simple and Compact Electrostatic Cs-Corrector using Annular and Circular Electrodes

Surface and Subsurface Microscopy and Analysis

Abstract

A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis

Complementing Secondary Ion Mass Spectrometry with other Ion-, Electron-and Photon-based Analytical Microscopies

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Characterization of Protein G B1 Immobilized Gold Nanoparticles using Time of Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

A Revolutionary Approach for Molecular Imaging with TOF-SIMS Parallel Imaging MS/MS

Sub-Micron Resolution Imaging with Bio-Molecular Identification by TOF-SIMS Parallel Imaging MS/MS

Imaging in Liquids through Ultra-thin Membranes: A Comparative Analysis of Scanning Electron and Scanning Microwave Microscopies

Atomic Force Microscopy of Polymer Systems: From Morphology to Properties to Chemical Imaging and Spectroscopy

Surface Modifications during a Catalytic Reaction: a Combined APT and FIB/SEM Analysis of Surface Segregation

A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications

Atomic Surface Structures of Oxide Nanoparticles with Well-defined Shapes

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

Surface and Subsurface Microscopy and Analysis

Abstract