Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

Multidimensional Analysis of Nanoscale Phase Separation in Complex Materials Systems

Improved Data Analysis and Reconstruction Methods for STEM-EDX Tomography

Quantifying the Advantages of Compressive Sensing and Sparse Reconstruction for Scanning Transmission Electron Microscopy

High Performance Computing Tools for Cross Correlation of Multi-Dimensional Data Sets Across Instrument Platforms

The Enabler Framework: an Object-Oriented Toolkit for Microscopy Data Analysis

Using Multivariate Analysis of Scanning-Rochigram Data to Reveal Material Functionality

Plasmons in Mesoscopic Gold Tapers

Temperature Dependence of the Volume Plasmon in Silicon Nanoparticles

Hyperspectral Imaging of Surface-Plasmon-Enhanced Local Electric Fields by EELS with Tunable <60meV Energy Resolution

Unveiling Nanometric Plasmons Optical Properties With Advanced Electron Spectroscopy in the Scanning Transmission Electron Microscope

Strategies for Obtaining High Spatial Resolution in Imaging and Spectroscopy of Beam-sensitive TEM Specimens

Quantitative Annular Dark-Field Imaging at Atomic Resolution

Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table

Linking Dopant Distribution and Interatomic Distortions at La1.6Mo.4CuO4/La2CuO4 Superconducting Interfaces

Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF

Initial Results From a CdTe High-Energy X-ray Detector on a TEM

Atomic-resolution EELS Study of Polarization of BaTiO3in the Interface With Metallic Manganite

Effective Method for Decreasing Detection Limit of Dopant Concentration in Semiconductor Using Dual SDD Analysis System

Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope

Study of Strain and Intermixing at the BaSnO3/SrTiO3and BaSnO3/LaAlO3Interfaces Using STEM and EELS

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract