Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 16 of 41

Image Analysis and Quantitative Microscopy

Research Article

Development of Bayesian Segmentation Techniques for Automated Segmentation of Titanium Alloy Images
JP Simmons, B Bartha, M De Graef, M Comer
Published online by Cambridge University Press:

03 August 2008, pp. 602-603
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Extracting Rich, Quantitative Information from Images Using Open-Source Software
AE Carpenter, TR Jones
Published online by Cambridge University Press:

03 August 2008, pp. 604-605
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determination of True Particle Size Distribution in High Impact Polystyrene (HIPS)
W Heckmann
Published online by Cambridge University Press:

03 August 2008, pp. 606-607
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Improvements in automated photometric stereo 3D SEM
R Pintus, S Podda, M Vanzi
Published online by Cambridge University Press:

03 August 2008, pp. 608-609
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM
ZH Sung, PJ Lee, DC Larbalestier
Published online by Cambridge University Press:

03 August 2008, pp. 610-611
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Failure Analysis: Real World Applications and Case Studies

Research Article

Catastrophic Failure of a Wheel Assembly in a Heavy Duty Off-Road 6X6 Vehicle
CN Johnson
Published online by Cambridge University Press:

03 August 2008, pp. 612-613
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Metallurgical and Metallographic Aspects of Engineering Failure Analysis
ME Stevenson, JL McDougall, MD Hayes
Published online by Cambridge University Press:

03 August 2008, pp. 614-615
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural Evaluation of Electron Beam Melted Ti-6Al-4V
JR Wooten, DP Dennies
Published online by Cambridge University Press:

03 August 2008, pp. 616-617
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Cosmetic Defects Due to Contamination in an Electroplated Deposit
KR Wasag, FE Schmidt
Published online by Cambridge University Press:

03 August 2008, pp. 618-619
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector
A Laquerre, MW Phaneuf
Published online by Cambridge University Press:

03 August 2008, pp. 620-621
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Failure Analysis of a Fractured Ductile Cast Iron Bracket
S Raebel
Published online by Cambridge University Press:

03 August 2008, pp. 622-623
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors
L Li, NT Nuhfer, M Skowronski
Published online by Cambridge University Press:

03 August 2008, pp. 624-625
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Identification of Surface Deposits found in Failures of Water Purification Filters and Membranes
JN Williard, JR Dominguez
Published online by Cambridge University Press:

03 August 2008, pp. 626-627
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Failure Analysis of a Tree Pruner Saw Blade Anchor Screw
ME Stevenson, MD Hayes, JL McDougall, ER Weishaupt, DA Turnquist
Published online by Cambridge University Press:

03 August 2008, pp. 628-629
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Failure Analysis of Peelable Seals Utilizing Light and Transmission Electron Microscopies
EI Garcia-Meitin, J Wooster, R Cotton, J McKenna
Published online by Cambridge University Press:

03 August 2008, pp. 630-631
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Investigation of Microcracks in a Multilayered Coating of a Camera Lens
Y-S Yu, Y-J Yoon, J-H Kim, H-S Kwon, B-K Kim
Published online by Cambridge University Press:

03 August 2008, pp. 632-633
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanostructure origin of leakage current in GaN/InGaN lighting emitting diode using patterned sapphire substrate
Y-J Yoon, B-K Kim, M Kim
Published online by Cambridge University Press:

03 August 2008, pp. 634-635
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluation of High Temperature Alloys in a Microturbine Recuperator Test Rig
JY Howe, RM Trejo, LR Walker, E Lara-Curzio, KL More
Published online by Cambridge University Press:

03 August 2008, pp. 636-637
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nuclear and Reactive Materials

Research Article

Electron Backscatter Diffraction (EBSD) Characterization of Twinning Related Deformation and Fracture in α-Uranium
RJ McCabe, RD Field, DW Brown, DJ Alexander, CM Cady
Published online by Cambridge University Press:

03 August 2008, pp. 638-639
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Preparation of Metal Surfaces for Optical Metallography and EBSD using Ion Beam Polishing
B Bridges
Published online by Cambridge University Press:

03 August 2008, pp. 640-641
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 16 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Image Analysis and Quantitative Microscopy

Research Article

Development of Bayesian Segmentation Techniques for Automated Segmentation of Titanium Alloy Images

Extracting Rich, Quantitative Information from Images Using Open-Source Software

Determination of True Particle Size Distribution in High Impact Polystyrene (HIPS)

Improvements in automated photometric stereo 3D SEM

Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM

Failure Analysis: Real World Applications and Case Studies

Research Article

Catastrophic Failure of a Wheel Assembly in a Heavy Duty Off-Road 6X6 Vehicle

Metallurgical and Metallographic Aspects of Engineering Failure Analysis

Microstructural Evaluation of Electron Beam Melted Ti-6Al-4V

Cosmetic Defects Due to Contamination in an Electroplated Deposit

Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector

Failure Analysis of a Fractured Ductile Cast Iron Bracket

Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors

Identification of Surface Deposits found in Failures of Water Purification Filters and Membranes

Failure Analysis of a Tree Pruner Saw Blade Anchor Screw

Failure Analysis of Peelable Seals Utilizing Light and Transmission Electron Microscopies

Investigation of Microcracks in a Multilayered Coating of a Camera Lens

Nanostructure origin of leakage current in GaN/InGaN lighting emitting diode using patterned sapphire substrate

Evaluation of High Temperature Alloys in a Microturbine Recuperator Test Rig

Nuclear and Reactive Materials

Research Article

Electron Backscatter Diffraction (EBSD) Characterization of Twinning Related Deformation and Fracture in α-Uranium

Preparation of Metal Surfaces for Optical Metallography and EBSD using Ion Beam Polishing

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Image Analysis and Quantitative Microscopy

Research Article

Failure Analysis: Real World Applications and Case Studies

Research Article

Nuclear and Reactive Materials

Research Article