Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T08:54:08.525Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector

Published online by Cambridge University Press:  03 August 2008

A Laquerre  and
MW Phaneuf
A Laquerre
Affiliation:
Fibics Incorporated, Canada
MW Phaneuf
Affiliation:
Fibics Incorporated, Canada
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 620 - 621
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)