Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

In Situ TEM at the Extremes

Transformations of Supported Gold Nanoparticles Observed by In Situ Electron Microscopy

Decomposition Behavior of III/V Semiconductor Precursor Gases in In-situ TEM MOVPE Investigations Observed by Mass Spectrometry

HRTEM and EELS Studies on the Structural and Chemical Modification of MoS2 and Graphite During In-situ Reactions with Li and Na

Liquid Cell Transmission Electron Microscopy Reveals the Role of Nano-silica in Cement Hydration Reactions

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

In Situ Micropillar Compression of Irradiated HT9

Thermal Expansion Coefficient of Silicon Nanoparticles with Nanometer Resolution

Field Emission from Zinc Oxide Nanowires

In-situ Liquid-cell TEM Studies of High Entropy Nanomaterials

Approaching Operando Imaging of Functional Materials

Characterization on AISI 316L Stainless Steel; Boriding, Nitriding and Boriding-Nitriding

Synthesis of Multi-walled Carbon Nanotubes by Spray Pyrolysis Method

Towards Chemical Kinetics for Operando Electron Microscopy of Catalysts: 3D Modeling of Product Gas Distributions and Temperature Profiles During Catalysis

Evaluation of Dispersion Stability of Al2O3 Nanoparticles in Jatropha curcas Oil

In situ/operando Study of Photoelectrochemistry Using Optical Liquid Cell Microscopy

Evaluating Carrier Longevity Including Chemical/Microstructural Integrity for Extended Cycling: Effects of Atmosphere and Temperature on Particle Integrity

Characterization Microstructural of Kevlar-based Composites Obtained by Vacuum Infusion Process

Characterization of Microstructure Obtained by Boronitriding of an AISI H13 Steel

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

An Optical Sectioning Method for 3D Reconstruction Using 4D-STEM

Inversion of Many-beam Bragg Intensities for Phasing by Iterated Projections : Removal of Multiple Scattering Artifacts.

The Potential Benefits of Compressed Sensing and Machine Learning for Advanced Imaging and Spectroscopy in the Electron Microscope

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

In Situ TEM at the Extremes

Approaching Operando Imaging of Functional Materials

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems