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Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Published online by Cambridge University Press:  30 July 2020

Yu Deng ,
Jim Ciston ,
Karen Bustillo ,
Colin Ophus ,
Ruopeng Zhang ,
Chengyu Song ,
Christoph Gammer  and
Andrew Minor
Yu Deng
Affiliation:
Nanjing University, Nanjing, Jiangsu, China (People's Republic)
Jim Ciston
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Karen Bustillo
Affiliation:
NCEM, Molecular Foundry, LBNL, Berkeley, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Ruopeng Zhang
Affiliation:
University of California-Berkeley, Berkeley, California, United States
Chengyu Song
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Christoph Gammer
Affiliation:
Austrian Academy of Sciences, Leoben, Wien, Austria
Andrew Minor
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States University of California-Berkeley, Berkeley, California, United States

Abstract

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Type
In Situ TEM at the Extremes
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2418 - 2419
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Copyright
Copyright © Microscopy Society of America 2020

References

Deng, Y., Gammer, C., Ciston, J., Ercius, P., Ophus, C., Bustillo, K., Song, C., Zhang, R., Wu, D., Du, Y., Chen, Z., Dong, H., Khachaturyan, A. G., Minor, A. M., Acta Materialia 181, 501 (2019).10.1016/j.actamat.2019.10.018CrossRefGoogle Scholar
Catalan, G., Seidel, J., Ramesh, R., Scott, J. F., Modern Phys. 84, 119 (2012).10.1103/RevModPhys.84.119CrossRefGoogle Scholar
Tang, Y. L., Zhu, Y. L., Ma, X. L., Pennycook, S. J., et al. Science 348, 547 (2015).10.1126/science.1259869CrossRefGoogle Scholar
Gammer, C., Ozdol, V. B., Liebscher, C.H., and Minor, A.M., Ultramicroscopy, 155, 1 (2015).10.1016/j.ultramic.2015.03.015CrossRefGoogle Scholar
Ozdol, V.B., Gammer, C., Jin, X.G., Ercius, P., Ophus, C., Ciston, J., Minor, A.M., Applied Physics Letters, 106, 253107 (2015).10.1063/1.4922994CrossRefGoogle Scholar
Deng, Yu, et al. ., Advanced Materials, 1906105 (2019).10.1002/adma.201906105CrossRefGoogle Scholar
Zhang, J. X., et al. ., Nature nanotechnology, 6, 97 (2011).Google Scholar