Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications

Silicon Substitution in Monolayer Hexagonal Boron Nitride

Sensing Interfacial Visible Light Absorption in TiO2-supported CeO2−x Photocatalyst Nanoparticles

TEM Analysis of Model Li-Ion Battery Cathodes Grown by Molecular Beam Epitaxy

Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

Correlation Microanalysis of Localized Molecular Structure and Nano-mechanical Property of PVDF Based Copolymer

In Situ and Ex Situ Energy-Filtered Transmission Electron Microscopy Studies on the Nanomorpholgy Evolution of Organic Bulk Heterojunction Solar Cells

Operando Scanning Transmission X-ray Microscopy of Co(OH)2 Oxygen Evolution Electrocatalysts

Understanding the Ordering of Charged Nanoparticles in Water

Microstructure Study on Initial Lithiation/Delithiation Cycle of Crystalline Silicon Wafer

Valence State Transformation of Rh on CeO2NR/γ-Al2O3 Composite Support

STXM Study on Layered Nanomaterials: Graphene & TMD

Synthesis and Structural Characterization of Co3O4 Electrocatalysts on Carbon Fiber Cloth with Tunable Morphologies and Electrochemical Properties

Identification of Anion Sites in BiCuXO (X= Se, S) Heteroanionic Materials

Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder

Quantification of La Dopant Level in La:SrSnO3/SrSnO3/BaSnO3 Heterostructures with STEM-EELS

Structural Analysis of HR-TEM Images of Ni-doped Zirconia Nanoparticles

TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle

TEM Study of MoOx/Ni and MoOx/Al Contacts for Silicon Solar Cells

Analytical Electron Microscopy Characterization of a Temperature-Stable Relaxor Ferroelectric Ceramic

Atomic Scale Recognition of Structure in the Intercalation of Sodium by Aberration-Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications