Addressing Limits: Single Atom Detection
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Potential for Optical Sectioning in Aberration-Corrected Z-contrast STEM
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- 01 August 2004, pp. 46-47
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Atomic Resolution Electron Tomography: A Dream?
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- 01 August 2004, pp. 48-49
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Research Article
Image-Based Nanocrystallography by Means of Transmission Electron Goniometry
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- 01 August 2004, pp. 50-51
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A New Approach for Electron Tomography: ADF-TEM
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- 01 August 2004, pp. 52-53
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Erosion of TEM Specimens in an Intense Electron Beam
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- 01 August 2004, pp. 54-55
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In Situ PEEL Spectroscopic Determination and EFTEM Imaging of Multiple Materials Properties at the Nanoscale Using Universality and Scaling in Solid-State Property-Plasmon Energy Relationships: New Capabilities for Analytical Electron Microscopy
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- 01 August 2004, pp. 56-57
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The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector
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- 01 August 2004, pp. 58-59
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The Dynamics of Nano-oxidation Reactions Visualized by in situ UHV-TEM
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- 01 August 2004, pp. 60-61
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Outlook of Application of Aberration Corrected-Electron Microscopy in the Ligandprotected Metal Clusters
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- 01 August 2004, pp. 62-63
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Retrieving Potential Maps from Reversed Multislice Calculations
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- 01 August 2004, pp. 64-65
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Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens
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- 01 August 2004, pp. 66-67
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Sub-Ångstrom Resolution with Aberration-Corrected TEM: Present and Future
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- 01 August 2004, pp. 68-69
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