Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-29T23:39:46.728Z Has data issue: false hasContentIssue false
  • English
  • Français

Probing the Electronic Structure of BaSnO3 by EELS Analysis and ab initio Calculations

Published online by Cambridge University Press:  04 August 2017

Hwanhui Yun ,
Mehmet Topsakal ,
Abhinav Prakash ,
Koustav Ganguly ,
Chris Leighton ,
Bharat Jalan ,
Renata M. Wentzcovitch ,
K. Andre Mkhoyan  and
Jong Seok Jeong
Hwanhui Yun
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Mehmet Topsakal
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Abhinav Prakash
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Koustav Ganguly
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Chris Leighton
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Bharat Jalan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Renata M. Wentzcovitch
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Jong Seok Jeong
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1602 - 1603
Copyright
© Microscopy Society of America 2017 

References

[1] Allen, S. J., et al, Appl. Phys. Lett 108 2016). p. 252107.CrossRefGoogle Scholar
[2] Singh, D. J., et al, Appl. Phys. Lett 104 2014). p. 011910.CrossRefGoogle Scholar
[3] Schumann, T., et al, JVST A 34 2016). p. 050601.Google Scholar
[4] van Benthem, K., et al, J. Appl. Phys. 90 2001). p. 6156.CrossRefGoogle Scholar
[5] Prakash, A., et al, JVST A 33 2015). p. 060608.Google Scholar
[6] Ganguly, K., et al, APL Materials 3 2015). p. 062509.CrossRefGoogle Scholar
[7] Yun, H., et al, arXiv:1611.09284 [cond-mat.mtrl-sci].Google Scholar
[8] This work was supported in part by the NSF MRSEC under award number DMR-1420013, also in part by NSF DMR-1410888, NSF EAR-134866 and EAR-1319361, by the Grant-in-Aid program of the University of Minnesota, and by the Defense Threat Reduction Agency, Basic Research Award #HDTRA1-14-1-0042 to the University of Minnesota.Google Scholar