Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T11:27:39.507Z Has data issue: false hasContentIssue false
  • English
  • Français

Non-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks

Published online by Cambridge University Press:  04 August 2017

Simon Hettler  and
Manuel Dries
Simon Hettler
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.
Manuel Dries
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 592 - 593
Copyright
© Microscopy Society of America 2017 

References

[1] Verbeeck, J, et al, Nature 464 2010 737–739.Google Scholar
[2] Verbeeck, J, et al, C R Phys 15 2014 190–199.CrossRefGoogle Scholar
[3] Durnin, J, et al, Phys Rev Lett 58 1987 1499–1501.CrossRefGoogle Scholar
[4] Grillo, V, et al, Ultramicroscopy 166 2016 48–60.CrossRefGoogle Scholar
[5] Hyun, , et al, Ultramicroscopy 109 2009 1–7.CrossRefGoogle Scholar
[6] S Hettler acknowledges funding from the Carl-Zeiss Stiftung.Google Scholar