Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T15:51:09.377Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ TEM Investigation of the Deformation Mechanisms and Microstructural Changes in Ultrafine-grained Non-textured Aluminum Film Using Automated Crystal Orientation Mapping

Published online by Cambridge University Press:  04 August 2017

Ehsan Izadi ,
Pedro Peralta  and
Jagannathan Rajagopalan
Ehsan Izadi
Affiliation:
Department of Mechanical and Aerospace Engineering School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona, USA
Pedro Peralta
Affiliation:
Department of Mechanical and Aerospace Engineering School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona, USA
Jagannathan Rajagopalan
Affiliation:
Department of Mechanical and Aerospace Engineering School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 768 - 769
Copyright
© Microscopy Society of America 2017 

References

[1] Izadi, E. & Rajagopalan, J. Scripta Materialia 114 2016). p. 65.CrossRefGoogle Scholar
[2] Izadi, E., et al, Materials & Design 113 2017). p. 186.CrossRefGoogle Scholar
[3] Izadi, E., et al, Microscopy and Microanalysis 22(S3 2016). p. 1950.CrossRefGoogle Scholar
[4] Izadi, E. & Rajagopalan, J. In A. Bajajet al(Eds.) Proceedings of the Society of Engineering Science 51st Annual Technical Meeting 2014.Google Scholar
[5] The authors acknowledge the use of facilities at the John M. Cowley Centre for High Resolution Electron Microscopy and the Centre for Solid State Electronics Research at Arizona State University.Google Scholar