Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-29T19:11:06.733Z Has data issue: false hasContentIssue false

Elements of a Purpose Built Electron Cryomicroscope for Single-particle CryoEM

Published online by Cambridge University Press:  30 July 2020

Christopher Russo
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, England, United Kingdom
Richard Henderson
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, England, United Kingdom

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Copyright
Copyright © Microscopy Society of America 2020

References

Russo, C.J. and Henderson, R.Charge accumulation in electron cryomicroscopyUltramicroscopy 187, 4349 (2018).10.1016/j.ultramic.2018.01.009CrossRefGoogle ScholarPubMed
Russo, C.J. and Henderson, R.Microscopic charge fluctuations cause minimal contrast loss in cryo-EMUltramicroscopy 187, 5663 (2018).10.1016/j.ultramic.2018.01.011CrossRefGoogle Scholar
Russo, C.J. and Henderson, R.Ewald sphere correction using a single side-band image processing algorithmUltramicroscopy 187, 2633 (2018).10.1016/j.ultramic.2017.11.001CrossRefGoogle ScholarPubMed
Peet, M.J., Henderson, R. & Russo, C.J.The energy dependence of contrast and damage in electron cryomicroscopy of biological moleculesUltramicroscopy 203, 125131 (2019).10.1016/j.ultramic.2019.02.007CrossRefGoogle ScholarPubMed
Naydenova, K., McMullan, G., Peet, M.J., Lee, Y., Edwards, P.C., Chen, S., Leahy, E., Scotcher, S., Henderson, R., Russo, C.J.CryoEM at 100 keV: a demonstration and prospectsIUCrJ 6, 10861098 (2019).10.1107/S2052252519012612CrossRefGoogle ScholarPubMed