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Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope

Published online by Cambridge University Press:  04 August 2017

Lei Jin ,
Juri Barthel ,
Chun Lin Jia  and
Knut W. Urban
Lei Jin
Affiliation:
Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.
Juri Barthel
Affiliation:
Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen, Germany.
Chun Lin Jia
Affiliation:
Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. School of Electronic and Information Engineering and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China.
Knut W. Urban
Affiliation:
Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. School of Electronic and Information Engineering and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 422 - 423
Copyright
© Microscopy Society of America 2017 

References

[1] Jin, L, et al Ultramicroscopy, in press. http://dx.doi.org/10.1016/j.ultramic.2016.12.026.CrossRefGoogle Scholar
[2] Uhlemann, S, et al, Phys. Rev. Lett 111 2013). p. 046101.CrossRefGoogle Scholar
[3] Uhlemann, S, et al, Ultramicroscopy 151 2015). p. 199.CrossRefGoogle Scholar
[4] Jia, C L, et al, Nature Mater 13 2014). p. 1044.CrossRefGoogle Scholar
[5] Lentzen, M Microsc. Microanal 14 2008). p. 16.CrossRefGoogle Scholar
[6] Kishida, T, et al, Microsc. Microanal 20(Suppl 3 2014). p. 132.CrossRefGoogle Scholar