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Topographic Measurements of Real Structures in reflection Confocal Laser Scanning Microscope (CLSM)

Published online by Cambridge University Press:  05 September 2003

S. Wessel ,
S. Pagel ,
M. Ritter ,
H. Hohenberg  and
R. Wepf
S. Wessel
Affiliation:
Beiersdorf AG, R & D Cosmed, analytical microscopy, Unnastrasse 48, D-20245 Hamburg, Germany
S. Pagel
Affiliation:
Beiersdorf AG, R & D Cosmed, analytical microscopy, Unnastrasse 48, D-20245 Hamburg, Germany
M. Ritter
Affiliation:
Heinrich-Pette-Institut, Electron Microscopy and Micro Technology Group Martinistrasse 52, 20251 Hamburg, Germany E-Mail: [email protected]
H. Hohenberg
Affiliation:
Heinrich-Pette-Institut, Electron Microscopy and Micro Technology Group Martinistrasse 52, 20251 Hamburg, Germany E-Mail: [email protected]
R. Wepf
Affiliation:
Beiersdorf AG, R & D Cosmed, analytical microscopy, Unnastrasse 48, D-20245 Hamburg, Germany
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 162 - 163
Copyright
Copyright © Microscopy Society of America 2003

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