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Advances in X-ray Analysis, Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987

Volume 31 - 1987

This volume was published under a former title. See this journal's title history.

Contents

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VIII. Synchrotron Radiation and Other Applications of XRF

Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry
Tomoya Arai, Kazuhiko Omote
Published online by Cambridge University Press:

06 March 2019, pp. 507-514
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In the speetrographie analysis of composite elements by fluorescent x-rays, significant developments have been made in low atomic number element measurement and improvement of analytical performance in trace element measurements.
For the analysis of trace elements, background intensity governs analytical accuracies and the lowest detection limit in a sample.

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Author Index
Published online by Cambridge University Press:

18 October 2019, pp. 515-516
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Subject Index
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18 October 2019, p. 517
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Front matter

PDX volume 31 Cover and Front matter
Published online by Cambridge University Press:

06 March 2019, pp. f1-f6
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Advances in X-ray Analysis, Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987

VIII. Synchrotron Radiation and Other Applications of XRF

Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry

Other

Author Index

Subject Index

Front matter

PDX volume 31 Cover and Front matter

Powder Diffraction

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Advances in X-ray Analysis, Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987

VIII. Synchrotron Radiation and Other Applications of XRF

Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry

Other

Author Index

Subject Index

Front matter

PDX volume 31 Cover and Front matter