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Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry

Published online by Cambridge University Press:  06 March 2019

Tomoya Arai  and
Kazuhiko Omote
Tomoya Arai
Affiliation:
Rigaku Industrial Corporation TakatsukI, Osaka, Japan
Kazuhiko Omote
Affiliation:
Rigaku Industrial Corporation TakatsukI, Osaka, Japan
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Extract

In the speetrographie analysis of composite elements by fluorescent x-rays, significant developments have been made in low atomic number element measurement and improvement of analytical performance in trace element measurements.

For the analysis of trace elements, background intensity governs analytical accuracies and the lowest detection limit in a sample.

Type
VIII. Synchrotron Radiation and Other Applications of XRF
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 507 - 514
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

(1) Spielberg, N. and Mechtilde Brandenstein, Applied Spectroscopy Vol. 17, No, 6-9 (1963) 222–225 Google Scholar
(2) Sorensen, lb, Spectrochimica Acta, Vol. 36 BNo. 3 (1981) 243–249 Google Scholar