1 results
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
-
- Journal:
- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 189-196
- Print publication:
- 1993
-
- Article
- Export citation