Strong multiple Bragg reflections (MBRs) which can be realized in a bent-perfect-crystal (BPC) slab provide a monochromatic beam of excellent resolution parameters. For identifying MBR effects in the BPC Si crystal, we used the method of azimuthal rotation of the crystal lattice around the scattering vector of the primary forbidden Si(200) reflection for a fixed chosen wavelength. In this paper, several azimuthal scans searching strong MBR effects with the intention of a possible practical exploitation for very high-resolution diffractometry are presented.
