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TEM Sample Preparation Using a New Nanofabrication Technique Combining Electron-Beam-Induced Deposition and Low-Energy Ion Milling
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 545-548
- Print publication:
- December 2006
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Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film Structures
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 1 / January 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 24-31
- Print publication:
- January 2001
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