2 results
Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 6 / December 2014
- Published online by Cambridge University Press:
- 05 November 2014, pp. 1638-1645
- Print publication:
- December 2014
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Off-Axis Electron Holography of Unbiased and Reverse-Biased Focused Ion Beam Milled Si p-n Junctions
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue 1 / February 2005
- Published online by Cambridge University Press:
- 28 January 2005, pp. 66-78
- Print publication:
- February 2005
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