3 results
Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 17 October 2016, pp. 321-328
- Print publication:
- April 2017
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Direct-Writing of Cu Nano-Patterns with an Electron Beam
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 6 / December 2015
- Published online by Cambridge University Press:
- 18 September 2015, pp. 1639-1643
- Print publication:
- December 2015
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Characterization of Nanoporous Materials with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 20 May 2015, pp. 557-563
- Print publication:
- June 2015
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