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Quantitative Fluctuation Electron Microscopy in the STEM: Methods to Identify, Avoid, and Correct for Artifacts
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 17 July 2014, pp. 1605-1618
- Print publication:
- October 2014
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- Article
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