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Refitting an X-ray diffraction system for combined GIXRF and XRR measurements
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- Journal:
- Powder Diffraction / Volume 35 / Issue S1 / December 2020
- Published online by Cambridge University Press:
- 01 July 2020, pp. S29-S33
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Laboratory-based characterization of heteroepitaxial structures: Advanced experiments not needing synchrotron radiation
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- Journal:
- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 29 February 2012, pp. 92-98
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