1 results
In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 1 / February 2015
- Published online by Cambridge University Press:
- 22 December 2014, pp. 140-153
- Print publication:
- February 2015
-
- Article
- Export citation