Burn-in is a method of ‘elimination’ of initial failures (infant mortality). In the conventional burn-in procedures, to burn-in a component or a system means to subject it to a fixed time period of simulated use prior to actual operation. Then those which fail during the burn-in procedure are scrapped and only those which survived the burn-in procedure are considered to be of satisfactory quality. Thus, in this case, the only information used for the elimination procedure is the lifetime of the corresponding item. In this paper we consider a new burn-in procedure which additionally employs a dependent covariate process in the elimination procedure. Through the comparison with the conventional burn-in procedure, we show that the new burn-in procedure is preferable under commonly satisfied conditions. The problem of determining the optimal burn-in parameters is also considered and the properties of the optimal parameters are derived. A numerical example is provided to illustrate the theoretical results obtained in this paper.

Environmental stress screening (ESS) of manufactured items is used to reduce the occurrence of future failures that are caused by latent defects by eliminating the items with these defects. Some practical descriptions of the relevant ESS procedures can be found in the literature; however, the appropriate stochastic modeling and the corresponding thorough analysis have not been reported. In this paper we develop a stochastic model for the ESS, analyze the effect of this operation on the population characteristics of the screened items, and also consider the relevant optimization issues.

Burn-in is a widely used engineering procedure useful for eliminating ‘weak’ items and consequently improving the quality of remaining items. The quality of items can be measured via various performance characteristics. In the present paper we develop new performance criteria for the burn-in method. Our criteria not only take into account the reliability of an item, they also incorporate covariates.

In this paper, the generalized burn-in and replacement model considered by Cha (2001) is further extended to the case in which the probability of Type II failure is time dependent. Two burn-in procedures are considered and they are compared in cases when both the procedures are applicable. Under some mild conditions on the failure rate function r(t) and the Type II failure probability function p(t), the problems of determining optimal burn-in time and optimal replacement policy are considered.

In this paper two burn-in procedures for a general failure model are considered. There are two types of failure in the general failure model. One is Type I failure (minor failure) which can be removed by a minimal repair or a complete repair and the other is Type II failure (catastrophic failure) which can be removed only by a complete repair. During a burn-in process, with burn-in Procedure I, the failed component is repaired completely regardless of the type of failure, whereas, with burn-in Procedure II, only minimal repair is done for the Type I failure and a complete repair is performed for the Type II failure. In field use, the component is replaced by a new burned-in component at the ‘field use age’ T or at the time of the first Type II failure, whichever occurs first. Under the model, the problems of determining optimal burn-in time and optimal replacement policy are considered. The two burn-in procedures are compared in cases when both the procedures are applicable.

We consider the problem of the optimal duration of a burn-in experiment for n identical units with conditionally exponential life-times of unknown parameter Λ. The problem is formulated as an optimal stopping problem for a suitably defined two-dimensional continuous-time Markov process. By exploiting monotonicity properties of the statistical model and of the costs we prove that the optimal stopping region is monotone (according to an appropriate definition) and derive a set of equations that uniquely determine it and that can be easily solved recursively. The optimal stopping region varies monotonically with the costs. For the class of problems corresponding to a prior distribution on Λ of type gamma it is shown how the optimal stopping region varies with respect to the prior distribution and with respect to n.

When a mission is assigned, it often is the case that the component used to perform the task is required to work properly during the period of the mission time. In other words, the probability of the event that this component does not fail within the allowable mission time should be as large as possible. This problem is considered for the case when the lifetime of a component has a bathtub-shaped failure rate function, and it is found that burn-in procedure is beneficial. An application of this result to the problem of minimizing the mean number of failures in a given period of mission time is also considered.