13 results
9 - Graphene Electronics
- from Part I
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- 2D Materials
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- 22 June 2017
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- 29 June 2017, pp 159-179
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Fluctuation Microscopy Studies of Aluminum Oxides Exposed to Different Electrolytes
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 812-813
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- August 2004
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Understanding Fluctuation Microscopy - A Statistical Theory
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 810-811
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- August 2004
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An Empirical Approach of Measuring RDF from Electron Diffraction Patterns.
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 808-809
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- August 2004
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Fluctuation Microscopy Studies of Medium-range Order Structures of Near Frictionless Carbon Films
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 798-799
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- August 2004
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Medium-Range Ordering in Amorphous Diamond-like Carbon Films after Thermal Annealing
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 814-815
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- August 2004
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Stress relaxation and medium-range order in diamond-like amorphous carbon films
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- MRS Online Proceedings Library Archive / Volume 839 / 2004
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- 01 February 2011, P5.5
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- 2004
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Increased Ordering in the Amorphous SiOx due to Hyperthermal Atomic Oxygen.
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- MRS Online Proceedings Library Archive / Volume 851 / 2004
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- 01 February 2011, NN9.5
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- 2004
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Fluctuation Microscopy Studies Of Aluminum Oxides Exposed To CL Ions
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- MRS Online Proceedings Library Archive / Volume 738 / 2002
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- 11 February 2011, G1.4
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- 2002
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Medium-Range Order Structures of Amorphous Diamond-Like Carbon Films
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- MRS Online Proceedings Library Archive / Volume 675 / 2001
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- 21 March 2011, W12.1.1
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- 2001
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Fluctuation Microscopy Studies of Medium-range Order Structures in Amorphous Tetrahedral Semiconductors
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- MRS Online Proceedings Library Archive / Volume 638 / 2000
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- 17 March 2011, F14.40.1
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- 2000
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Bubble formation and growth in glasses
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- MRS Online Proceedings Library Archive / Volume 540 / 1998
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- 15 February 2011, 331
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- 1998
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The effect of processing conditions on the structure of buried interfaces between silicon and silicon dioxide
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- MRS Online Proceedings Library Archive / Volume 448 / 1996
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- 03 September 2012, 303
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- 1996
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