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Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1572-1573
- Print publication:
- July 2012
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- Article
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