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F33 Multi-Spectral XRF Counting: Squeeze Twice as much Information from Your Detector
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 172
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X-ray Spectrometry In The Fast Lane: An Introduction To High Speed Digital Processing Techniques And Their Application To Emerging EDS Technologies
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 76-77
- Print publication:
- August 2002
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