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Platform for in-plane ZT measurement and Hall coefficient determination of thin films in a temperature range from 120 K up to 450 K
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- Journal:
- Journal of Materials Research / Volume 31 / Issue 20 / 28 October 2016
- Published online by Cambridge University Press:
- 27 October 2016, pp. 3196-3204
- Print publication:
- 28 October 2016
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- Article
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