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Cryo-EM Information Management System and Sample Evaluation at Stanford-SLAC Cryo-EM Center
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1304-1305
- Print publication:
- August 2022
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JADAS: JEOL Automated Data Acquisition System For Cryo-EM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 438-439
- Print publication:
- August 2007
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Reflection High-Energy Electron Diffraction as an Intrinsic Material Property Sensor for Machine Condition Transfer Function in Molecular Beam Epitaxial Growth of III-V Compound Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 502 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 47
- Print publication:
- 1997
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