4 results
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 202-203
- Print publication:
- August 2019
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Correlative Defect Characterization in Semiconductors via Electron Channeling Contrast Imaging and Scanning Deep Level Transient Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1056-1057
- Print publication:
- August 2018
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Nano-Cathodoluminescence Measurement of Asymmetric Carrier Trapping and Radiative Recombination in GaN and InGaN Quantum Disks
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 2 / April 2018
- Published online by Cambridge University Press:
- 27 April 2018, pp. 93-98
- Print publication:
- April 2018
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Threading Dislocations in Metamorphic In0.20Ga0.80As Grown on GaAs Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1652-1653
- Print publication:
- July 2011
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