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Comparative High-Resolution X-Ray Diffraction Analysis of GaN/AlGaN Heterostructure on Al2O3 and Si (111) Substrate Grown by Plasma Assisted Molecular Beam Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1754 / 2015
- Published online by Cambridge University Press:
- 07 May 2015, pp. 129-134
- Print publication:
- 2015
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- Article
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