4 results
ZEISS ORION NanoFab: New SIMS Spectrometer
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 526-527
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- August 2019
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NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams
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- Journal:
- Microscopy Today / Volume 27 / Issue 3 / May 2019
- Published online by Cambridge University Press:
- 03 May 2019, pp. 22-27
- Print publication:
- May 2019
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Imaging Contrast with Multiple Ion Beams
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 701-702
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- August 2015
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Imaging Contrast with Multiple Ion Beams
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 345-346
- Print publication:
- August 2015
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