The {001} surface of magnesium oxide (MgO) has been the focus of numerous studies, which were prompted by the importance of MgO for its use as a substrate for thin film growth and also as a chemical catalyst. In the present work, atomic force microscopy (AFM) was used for studying the dynamics of surface processes of MgO which occur at elevated temperatures. AFM was chosen, in part, because it allows for imaging of topographical details at the atomic level with minimal sample preparation. Additionally, because the surface morphology of the same area was traced through a series of heat treatments, scanning electron microscopy analysis would be difficult because no conductive coating could be used (such a coating may have altered the surface between subsequent heat treatments).
AFM images were recorded in contact mode, in air, on a Nanoscope III (Digital instruments, Santa Barbara, CA) using Si3N4 cantilevers (Ultralevers, Park Inst., Sunnyvale, CA) with a nominal applied force of 10-15 nN.