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Characterization of Perovskite-Like Substrates for Thin Film Superconductors using Synchrotron X-Ray Topography
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- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 255-261
- Print publication:
- 1991
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- Article
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