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High-resolution electron imaging of amorphous layers with aberration-corrected probes
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 940-941
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- August 2008
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Effects of Tilt on High-Resolution ADF-STEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 904-905
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- August 2007
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Effect of Amorphous Layers on ADF-STEM Imaging using Aberration-Corrected Probes
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1202-1203
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- August 2007
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Electron Damage of CdSe Quantum Rods
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 498-499
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- August 2006
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Shape of CdSe Quantum Rods using Quantitative ADF STEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1458-1459
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- August 2005
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Single Crystal High Frequency Cavity-based EPR Spectroscopy of Single Molecule Magnets
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- Journal:
- MRS Online Proceedings Library Archive / Volume 746 / 2002
- Published online by Cambridge University Press:
- 10 February 2011, Q1.4
- Print publication:
- 2002
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