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Reliability Issues with Mixed-Signal CMOS Technology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 47
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- 1995
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Effect of TiW As Adhesion Layer And Underlying Metal On Electromigration Characteristics of Tungsten Via Plugs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 161
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- 1993
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Effects of Line Width, Thickness and Alloy Temperature on the Breakdown Energy of thin Aluminum Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 260 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 723
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- 1992
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Effects of Line Width, Thickness and Alloy Temperature on the Breakdown Energy of Thin Aluminum Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 265 / 1992
- Published online by Cambridge University Press:
- 15 February 2011, 165
- Print publication:
- 1992
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