7 results
Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 6 / December 2015
- Published online by Cambridge University Press:
- 14 September 2015, pp. 1644-1648
- Print publication:
- December 2015
-
- Article
- Export citation
Extensive Analysis of Structure-Property Relationships in Thin-Film Solar Cells Using Scanning Electron Microscopy in Combination with Focused Ion Beam
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1096-1097
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
-
- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
- Print publication:
- May 2012
-
- Article
-
- You have access
- HTML
- Export citation
Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 12 September 2011, pp. 728-751
- Print publication:
- October 2011
-
- Article
- Export citation
Optimized FIB Sample Preparation for Atomic Resolution Analytical STEM at Low kV - A Key Requirement for Successful Application
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 630-631
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Applications of Atomic-Resolution EELS Mapping at Low kV
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 786-787
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Study of Failure Factors for the Collapse of PVDF Pipelines
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 122-123
- Print publication:
- August 2007
-
- Article
- Export citation