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F-24 Study of Microheterogeneity Using μ XRF, INAA, and Chemometric Methods
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 179
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Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 1 / February 2010
- Published online by Cambridge University Press:
- 24 December 2009, pp. 1-12
- Print publication:
- February 2010
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Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1312-1313
- Print publication:
- August 2005
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