3 results
EELS Characterization of Boron Nanowires and Boron Nitride Nanotubes
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 374-375
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- August 2004
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In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1112-1113
- Print publication:
- August 2004
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Approaches and Tools for Analyzing Low-loss EELS Spectra and Spectrum Images
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 862-863
- Print publication:
- August 2004
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