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Automated STEM/EDS Metrology Characterization of 3D NAND Devices
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1458-1459
- Print publication:
- July 2017
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HI Column Density Distribution Function at z = 0: Connection to Damped Lyα Statistics
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- Journal:
- Publications of the Astronomical Society of Australia / Volume 16 / Issue 1 / 1999
- Published online by Cambridge University Press:
- 05 March 2013, pp. 100-105
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