2 results
Electromigration Induced Failure as a Function of Via Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 401
- Print publication:
- 1997
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- Article
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Electromigration Lifetime and Step Coverage in Al/Cu/Si Thin Film Conductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 107
- Print publication:
- 1991
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- Article
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