6 results
Development of TV-rate CCD Cameras for in-situ Electron Microscopy
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- Journal:
- Microscopy Today / Volume 16 / Issue 3 / May 2008
- Published online by Cambridge University Press:
- 14 March 2018, pp. 16-19
- Print publication:
- May 2008
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Energy Contrast from Si Low Loss at 74 eV for Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 22 July 2003, pp. 490-491
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- August 2003
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Further Applications of Energy Filtered TEM in Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 626-627
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- August 2002
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FIB/TEM Sample Preparation using a Wafer Dicing Saw
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 500-501
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- August 2000
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TEM Characterization of Arsenic and Phosphorus Implanted Silicon Devices
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 467-468
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- August 1997
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Pulsed-laser deposition of polytetrafluoroethylene
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- Journal:
- Journal of Materials Research / Volume 10 / Issue 4 / April 1995
- Published online by Cambridge University Press:
- 03 March 2011, pp. 1038-1043
- Print publication:
- April 1995
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