2 results
Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1258 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1258-P06-02
- Print publication:
- 2010
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- Article
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Scanning Spreading Resistance Microscopy For 3D-Carrier Profiling in FinFET-based Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1070 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1070-E01-11
- Print publication:
- 2008
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- Article
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