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Measuring Thickness Changes in Thin Films Due to Chemical Reaction by Monitoring the Surface Roughness with In Situ Atomic Force Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue 5 / October 2002
- Published online by Cambridge University Press:
- 27 November 2002, pp. 422-428
- Print publication:
- October 2002
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Trigonometric parallaxes of Planetary Nebulae
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- Journal:
- Symposium - International Astronomical Union / Volume 180 / 1997
- Published online by Cambridge University Press:
- 25 May 2016, pp. 40-45
- Print publication:
- 1997
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- Article
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Carbonaceous Materials Containing Silicon as Anodes for Lithium-Ion Cells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 393 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 305
- Print publication:
- 1995
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