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Slant-Scanning and Interstice-Bridging Applied to ZMR to Improve the Quality of Recrystallized Si Films on Quartz
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 125
- Print publication:
- 1986
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- Article
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