2 results
Simulation analysis of 1250 kV HRTEM images for threading dislocations in GaN grown on sapphire
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1752-1753
- Print publication:
- July 2012
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A Multilayer Interconnect Process for 0.5um Logic Technology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 81
- Print publication:
- 1994
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- Article
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